MIL-STD-750D
NOTICE 4
30 April 2001
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
TO ALL HOLDERS OF MIL-STD-750D:
1. THE FOLLOWING PAGES OF MIL-STD-750D HAVE BEEN REVISED AND SUPERSEDE THE PAGES
LISTED:
NEW PAGE DATE SUPERSEDED PAGE DATE
15 30 April 2001 15 29 February 2000
16 30 April 2001 16 29 February 2000
17 30 April 2001 17 29 February 2000
18 30 April 2001 18 29 February 2000
19/20 30 April 2001 19/20 29 February 2000
2. THE FOLLOWING TEST METHODS OF MIL-STD-750D HAVE BEEN REVISED AND SUPERSEDE THE TEST
METHOD LISTED:
METHOD DATE SUPERSEDED METHOD DATE
1018.1 30 April 2001 1018 28 February 1995
1071.7 30 April 2001 1071.6 18 May 1995
2069.2 30 April 2001 2069.1 23 February 1996
2071.5 30 April 2001 2071.4 28 February 1995
2073.1 30 April 2001 2073 28 February 1995
3131.3 30 April 2001 3131.2 28 February 1995
3471.2 30 April 2001 3471.1 28 February 1995
4066.4 30 April 2001 4066.3 28 February 1995
3. THE FOLLOWING NEW METHODS HAVE BEEN ADDED:
METHOD TITLE DATE
1033 Reverse Voltage Leakage Stability 30 April 2001
4. RETAIN THIS NOTICE AND INSERT BEFORE TABLE OF CONTENTS.
AMSC N/A 1 of 2 FSC 5961
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
INCH-POUND
NOTICE OF
CHANGE
The documentation and process conversion
measures necessary to comply with this
notice shall be completed by 30 July 2001.
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