MIL-STD-750D
NOTICE 5
12 November 2002
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
TO ALL HOLDERS OF MIL-STD-750D:
1. THE FOLLOWING PAGES OF MIL-STD-750D HAVE BEEN REVISED AND SUPERSEDE THE PAGES
LISTED:
NEW PAGE DATE SUPERSEDED PAGE DATE
15 12 November 2002 15 30 April 2001
16 12 November 2002 16 30 April 2001
17 12 November 2002 17 30 April 2001
18 12 November 2002 18 30 April 2001
19/20 12 November 2002 19/20 30 April 2001
2. THE FOLLOWING TEST METHODS OF MIL-STD-750D HAVE BEEN REVISED AND SUPERSEDE THE TEST
METHOD LISTED:
METHOD DATE SUPERSEDED METHOD DATE
1018.2 12 November 2002 1018.1 30 April 2001
2071.6 12 November 2002 2071.5 30 April 2001
2074.4 12 November 2002 2074.3 23 February 1996
3131.4 12 November 2002 3131.3 30 April 2001
3306.4 12 November 2002 3306.3 28 February 1995
4023.1 12 November 2002 4023 28 February 1995
3. THE FOLLOWING NEW METHODS HAVE BEEN ADDED:
METHOD TITLE DATE
1057 Resistance to glass cracking 12 November 2002
3100 Junction temperature measurement 12 November 2002
4. RETAIN THIS NOTICE AND INSERT BEFORE TABLE OF CONTENTS.
AMSC N/A 1 of 2 FSC 5961
DISTRIBUTION STATEMENT A
. Approved for public release; distribution is unlimited.
INCH-POUND
The documentation and process conversion measures
necessary to comply with this notice shall be completed by 5
January 2003.
NOTICE OF
CHANGE
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